Atomic Force Microscopy modes

ImagingCharacterizationManipulation

Contact

Non-Contact

In this mode, the cantilever tip is brought into mechanical contact with the sample surface. This mode is suitable for hard samples with sharp tips.

It is the most extended imaging mode in ambient air and in a liquid environment. In this mode force is less, therefore destruction of the tip and the soft sample is less.

Tapping

(Frequency Modulation (FM

The principle of this mode is the mixture of contact and noncontact. This mode is suitable for soft and sensitive samples with high precision.

In Frequency Modulation AFM (FM-AFM), the cantilever acts as the oscillator in an active feedback circuit. FM-AFM is usually used in ultra-high vacuum.

(Lateral Force Microscopy (LFM

(Magnetic Force Microscopy (MFM

The principle of Lateral Force Microscopy (LFM) is very similar to contact mode AFM.

The Magnetic Force Microscope (MFM) is a variety of Atomic Force Microscope and the principle is similar to noncontact mode.

(Electric Force Microscopy (EFM

Force Spectroscopy

Electrostatic Force Microscopy (EFM) is a type of dynamic non-contact Atomic Force Microscopy where the electrostatic force is probed.

Atomic Force Microscope (AFM) Spectroscopy is an AFM based technique to measure, and sometimes control the polarity and strength of the interaction between the AFM tip and the sample.

(Force Modulation Microscopy (FMM

(Kelvin Probe Force Microscopy (KPFM

Force Modulation Microscopy (FMM) is an extension of AFM imaging that operates in contact Atomic Force Microscopy mode.

Kelvin Brobe Force Microscopy (KPFM) is a tool that enables nanometer-scale imaging of the surface potential on a broad range of materials.

 Conductive Atomic Force Microscopy (C-AFM)

Piezoresponse Force Microscopy (PFM)

Conductive Atomic Force Microscopy (C-AFM) is a mode of Atomic Force Microscopy in which a conductive tip is scanned in contact with the sample surface, while a voltage is applied between the tip and the sample, generating a current image.

PFM can be employed to study multi- domain structures and domain distributions of the ferroelectric thin film using AFM technique

Manipulation & Nano- Lithography

Normally AFM is used to image a surface without damaging it. However, AFM can be used to modify the surface deliberately, by applying either excessive force, or by applying high-field pulses.