Contact |
Non-Contact |
In this mode, the cantilever tip is brought into mechanical contact with the sample surface. This mode is suitable for hard samples with sharp tips. |
It is the most extended imaging mode in ambient air and in a liquid environment. In this mode force is less, therefore destruction of the tip and the soft sample is less. |
Tapping |
(Frequency Modulation (FM |
The principle of this mode is the mixture of contact and noncontact. This mode is suitable for soft and sensitive samples with high precision. |
In Frequency Modulation AFM (FM-AFM), the cantilever acts as the oscillator in an active feedback circuit. FM-AFM is usually used in ultra-high vacuum. |
(Lateral Force Microscopy (LFM |
(Magnetic Force Microscopy (MFM |
The principle of Lateral Force Microscopy (LFM) is very similar to contact mode AFM. |
The Magnetic Force Microscope (MFM) is a variety of Atomic Force Microscope and the principle is similar to noncontact mode. |
(Electric Force Microscopy (EFM |
Force Spectroscopy |
Electrostatic Force Microscopy (EFM) is a type of dynamic non-contact Atomic Force Microscopy where the electrostatic force is probed. |
Atomic Force Microscope (AFM) Spectroscopy is an AFM based technique to measure, and sometimes control the polarity and strength of the interaction between the AFM tip and the sample. |
(Force Modulation Microscopy (FMM |
(Kelvin Probe Force Microscopy (KPFM |
Force Modulation Microscopy (FMM) is an extension of AFM imaging that operates in contact Atomic Force Microscopy mode. |
Kelvin Brobe Force Microscopy (KPFM) is a tool that enables nanometer-scale imaging of the surface potential on a broad range of materials. |
Conductive Atomic Force Microscopy (C-AFM) |
Piezoresponse Force Microscopy (PFM) |
Conductive Atomic Force Microscopy (C-AFM) is a mode of Atomic Force Microscopy in which a conductive tip is scanned in contact with the sample surface, while a voltage is applied between the tip and the sample, generating a current image. |
PFM can be employed to study multi- domain structures and domain distributions of the ferroelectric thin film using AFM technique |
Manipulation & Nano- Lithography |
Normally AFM is used to image a surface without damaging it. However, AFM can be used to modify the surface deliberately, by applying either excessive force, or by applying high-field pulses. |