Surface visual inspection and analyses is regarded a valuable mean in experimental research and has played a great role in technology development in the last century.

In order to overcome the shortcomings of optical microscope, due to limitation in size visualization caused by light wavelength limit and diffraction, Electron microscope were developed. Electron microscopes in turn had their own weakness when it comes to imaging in non-vacuum environment and imaging with no prior modifications performed on the samples.

In the last decade of 20th century Atomic Force Microscopes were developed and a new milestone was created in Nano visualization and analyses of material surfaces.

Any sample type bio, metal, non-metal, polymers, etc. may be scanned by AFM in various environments; air, liquid, vacuum and non-air gas under different physical conditions; temperature, pressure, electrical and magnetic field, etc.

AFM Applications :

1. Nano Imaging

scanning the surface of samples in nanoscale in X & Y array and angstrom scale for z array.

2. Nano Properties Determination

Obtaining physical properties of samples including mechanical, Electrical and magnetic in nanoscale.

3. Nano Lithography and Manipulation