ARA AFM is an atomic force microscope for nanometer imaging. This device is a high resolution and quality nanoscope that is designed as a desktop device for various applications. All functional modes can be used only by preparing the relevant kit in this device
Atomic Force Microscopy has a wide application in special applications :
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Nanolithography
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Nano machining of surfaces
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Nanoscale analysis of cutting tools
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Nanoscale analysis of various ceramics
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And …
Atomic Force Microscopy has a wide application in Food industry :
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Property analysis of nano filters
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Property analysis of gelatins
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Nano structural and rheology analysis of various materials in food science
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And …
Atomic Force Microscopy has a wide application in industry :
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Nano-analysis of coatings (abrasive propert, hardness)
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Nano-analysis and quality control of microelectronic products
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Nano-analysis and quality control of data storage products
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And …
Atomic Force Microscopy has a wide application in polymer engineering and coatings :
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Surface morphology of polymer films
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Nano mechanical measurements
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Analysis of polymerization process
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And …
Atomic Force Microscopy has a wide application in physics :
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Surface analysis in precision optics
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Magnetic and electrical analysis of materials in nano scale
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And …
Atomic Force Microscopy has a wide application in Metallurgy and material science :
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Morphological analysis of various samples
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Size analysis of nano particles
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Crack analysis in fracture mechanics
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Fatigue analysis in fracture mechanics
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Fatigue analysis in nano scale
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Roughness analysis
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Tribology of surfaces…
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And …
Atomic Force Microscopy has a wide application in Medical science and bio technology :
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Pathology in nano scale
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Monitoring of the effect of medicines by coating them on the AFM tip
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Imaging of DNA, RNA, chromosomes, cell membranes, bacteria etc
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Effect of diffrent agents on various cells
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All researches in synthesis of medicines
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Interaction analysis of antigens and antibodies
ARA AFM main software features :
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Scanning in Non-vacuumed environment
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No sample preparation needed/p>
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Moderate cost and ignorable energy consumption
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Wide application range
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No restriction in sample material
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small eccupying space
ARA AFM main software features :
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Advanced digital filtering
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Improved error compensation
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Fast Frequency Response acquisition
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Sample movement capabilities
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Camera light intensity variations
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Extensive control parameters variation s
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Multi Model Device Specifications |
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Parameter |
Value |
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Scanning range |
40-50 microns |
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Lateral resolution |
1 nano |
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Vertical resolution |
0.1 nano |
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Laser power |
1 mW |
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Sensor bandwidth |
7 MHz |
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Actuator bandwidth |
70 KHz |
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Optical sensor sensitivity |
0.18 A/W |
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The approach steps |
0.6 microns |
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Sample movement range |
7 mm |
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AFM models |
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Full Plus Mode |
Full Model |
Advanced Model |
Standard Model |
Mode |
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Contact Mode |
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Dynamic Mode |
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Tapping Mode |
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Lateral Force Microscopy (LFM) |
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Magnetic Force Microscopy (MFM) |
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Electric Force Microscopy (EFM) |
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Force Spectroscopy |
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Nano-Lithography (chemical) |
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Nano-Lithography (Mechanical) |
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Force Modulation |
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Kelvin Microscopy |
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Conductive Atomic Force Microscopy (C-AFM) |
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Piezoresponse Force Microscopy (PFM) |
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