Scanner

XY Scanner

50 μm maximum XY scan range (The possibility to customize to 100 μm

1 nm XY resolution

Z Scanner

3 μm Maximum Z movement range

0.1 nm Z resolution

Electronics

Plug and Play control box

ADC and DAC Channels

4 Channel ADC 24bit

4 Channel DAC 24bit

Signal processing

40 MHz Frequency zynq processor

Integrated functions

100 MB/sec Via LAN

Stage

XY Stage

Mechanical Stage 12 mm Travel range

Head Stage

Mechanical XY stage: Positioning cantilever in the center of the objective lens

Software

Data acquisition

Real-time 100 MB/sec Microsoft Windows compatible

Integrated optical view windows for sample and cantilever vision

Monitoring all system signals with a high-rated oscilloscope

Auto saving captured images in the software gallery

Scanning zoom-selected area on captured images

Automatic fast approach of the cantilever to the sample surface (Auto Fast Approach)

Image processing

Independent software for image processing, data analysis, and presentation

The capability of exporting different data of images Built-in with all Microsoft OS

Sample Mount

75 x 26 mm microscope slide mounting

Customized 50 mm culture dish

Slide and culture dish holder spring

-10 V to +10 V Bias voltage range to the sample

Inverted Microscope

See Table of Inverted Microscope Items

AFM Unit

Plug and Play

Dimension

580 mm × 370 mm × 600 mm

Net Weight

20 Kg

Dedicated all in one (AIO) Computer

21” Display Monitor: 1920 *1080 Resolution

The latest generation of processors

8 GB RAM

Head

High precision adjustment micrometer

Optic designed for both dry and liquid environments

670 nm Laser frequency

5 mW Maximum laser diode power

High-grade quadruple photo-diode

Dithering mechanism

Optimized optical path design

Spring lever tip holder mechanism

Chip alignment mount for accurate tip mounting

Head Z actuators

3 independent Z positioning actuator for Leveling ability

15 mm Travel range

40 nm Movement steps

Automatic engagement of the cantilever to the sample surface (Auto Fast Approach)

Options

8-Megapixel resolution, color

60X to 600X Optical zoom

Integrated lighting

Include microscope dimmer

XY Scanner

Possibility to customize the XY scan range to 100 µm

Tip changing kit

Vacuum pen

Standard Modes

Contact Mode (Static, DC)

Non-Contact Mode (Dynamic, AC)

Tapping Mode (Semi-Contact, Intermittent-Contact)

Accessories

Sample mounting kit

The sample substrate

Various types of cantilevers

Tweezers and magnet box head-holder unit

Fly Kit

Magnetic Force Microscopy (MFM)

Electric Force Microscopy (EFM)

Phase imaging

Pro Contact Kit

Lateral Force Microscopy (LFM)

Force Spectroscopy

Mechanical Nano-Lithography

Experts Kit

Chemical Nano-Lithography

Force Modulation Microscopy (FMM)

Conductive AFM (C-AFM)

Kelvin Probe Force Microscopy (KPFM)

Piezo response Force Microscopy (PFM)

Head

Seidentopf Trinocular Head Inclined 45°, Interpupillary Distance 48~76 mm, Light Split Switch E100:P0 / E20:P80

Eyepiece

WF10x/22 mm, Dia.30 mm, High Eyepoint, Diopter Adjustable

Nosepiece

Quintuple

LWD Infinity Plan Objectives

LPL 4× / 0.11

W.D. = 12.1 mm

LPLAN 10× / 0.25

W.D. = 8.3 mm

LPLAN 20× / 0.40

W.D. = 7.2 mm

LPLAN 40× / 0.60

W.D. = 3.4 mm

LWD Infinity Plan Fluorescent Objectives

L Plan FL 10x / 0.25

W.D.= 10.3 mm

L Plan FL 20x / 0.45

W.D.= 5.8 mm

L Plan FL 40x / 0.65

W.D.= 5.1 mm

LWD Infinity Plan Phase Contrast Fluorescent Objectives Newly Update 2021

L Plan FL PHP 20x / 0.45

W.D.= 5.8 mm

L Plan FL PHP 40x / 0.65

W.D.= 5.1 mm

Phase Contrast

Centering Telescope 11x

Annular Spot

4x

20x / 40x

10x

Working Stage

Mechanical Stage Size 210 x 241mm, Round Slide Size Φ110 mm

Condenser

Long Working Distance, Quickly Detachable, N.A.0.3, Working Distance 72 mm (With Condenser), 195 mm (Without Condenser).

Transmit Illumination

Koehler Illumination Halogen 6V/30 W, Input Voltage 100 V ~ 240 V

Filter

Blue, Dia.34 mm

Reflect Illumination

Green, Dia.34 mm

Inverted Fluorescent

Optional