Scanner

XY Scanner

20-70 μm maximum XY scan range

1 nm XY resolution

Z Scanner

4 μm Maximum Z movement range

0.1 nm Z resolution

Electronics

Plug and Play control box

ADC and DAC Channels

4 Channel ADC 24bit

4 Channel DAC 24bit

Signal processingr

40 MHz Frequency zynq processor

Integrated functions

100 MB/sec Via LAN

Stage

XY Stage

Motorized software-controlled

15 mm Travel range

40 nm Movement steps

Z Stage

15 mm Travel range

40 nm Movement steps

Automatic engage of the cantilever to the sample surface (Auto Fast Approach)

Software

Data acquisition

Real-time 100 MB/sec Microsoft Windows compatible

Integrated optical view windows for sample and cantilever vision

Monitoring all system signals with a high rated oscilloscope

Auto saving captured images in software gallery

Scanning zoom-selected area on captured images

Automatic fast approach of cantilever to the sample surface (Auto Fast Approach)

Image processing

Independent software for image processing, data analysis and presentation

Capability of exporting different data of images

Built-in with all Microsoft OS

Sample Mount

20 mm Maximum sample diameter

10 mm Maximum sample thickness

Includes light magnetic sample holder

-10 V to +10 V Bias voltage range to the sample

Top Veiw Optical Microscope

8-Megapixel resolution, color

60X to 600X Optical zoom

Integrated lighting

Include microscope dimmer

Dedicated all in one (AIO) Computer

21” Display Monitor: 1920 *1080 Resolution

The latest generation of processors

8 GB RAM

Head

High precision adjustment micrometer

670 nm Laser wavelength

5 mW Maximum laser diod power

High grade quadruple photo-diode

Dithering mechanism

Optimized optical path design

Spring lever tip holder mechanism

AFM Unit

Plug and Play

Dimension

300 mm × 400 mm × 300 mm

Net Weight

20 Kg

Accessories

Sample mounting kit

The sample substrate

Various types of cantilevers

Tweezers and magnet box

Options

XY Scanner

Possibility to customize the XY scan range to 100 µm

Tip changing kit

Vacuum pen

Fly Kit

Magnetic Force Microscopy (MFM)

Electric Force Microscopy (EFM)

Phase imaging

Pro Contact Kit

Lateral Force Microscopy (LFM)

Force Spectroscopy

Mechanical Nano-Lithography

Experts Kit

Chemical Nano-Lithography

Force Modulation Microscopy (FMM)

Conductive AFM (C-AFM)

Kelvin Probe Force Microscopy (KPFM)

Piezoresponse Force Microscopy (PFM)