The use of high-resolution microscopic imaging is continuously increasing in engineering, material science, medical, natural science, and other fields. In many applications, the characterization of surfaces requires spatial resolution of nanometres or lower. Atomic force microscopy (AFM), although a relatively newly developed technique, has now become a powerful technology for characterization of the surface of materials down to the atomic scale. AFM can be used to obtain nanoscale chemical, mechanical (elastic modulus, stiffness, viscoelastic, frictional), electrical, magnetic properties and many more information. In comparison with other microscopy techniques, AFM offers low cost, simplicity in operation, and imaging capability to atomic resolution. It is a powerful non-destructive analytical technique which can be used in air, liquid, or vacuum.

In material science AFM shows spatial ability for Polymeric Materials, Nano-materials, Metals and Ceramics, Energy Materials, Electronic Materials, Surface Science and …

AFM applications in this science fields are studying surface structure, studying crystallization process and Recrystallization, study of sample’s conductivity and image electrical properties, measuring Forces and Deformations in polymetric materials, 3D characterization of nanoparticles, measurements of semiconductor dopant profiling and quality control for dielectric films and oxide layers, investigation of interfacial reaction and instability on the surface of electrode materials, Mapping Nanomechanical Properties, Investigating Morphology and Structure, Investigation of scratch resistance, Detection of surface contamination, Properties of flexible transparent polymers and many more undiscovered applications.